By Joe Kelly
That includes beneficial enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its variety source bargains skilled engineers a complete figuring out of the complex subject matters in RF, SiP (system-in-package), and SoC (system-on-a-chip) construction trying out which are severe to their paintings regarding semiconductor units. The booklet covers key size techniques for semiconductor machine trying out and assists engineers in explaining those suggestions to administration to help cut back undertaking rate, time, and assets. in response to real-world adventure and filled with time-saving equations, this in-depth quantity bargains execs useful info on crucial issues that experience by no means been offered in one reference ahead of.
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Extra info for Advanced Production Testing of RF, SoC, and SiP Devices
4 Spectral Mask Measurements Whenever a device is designed, it is the goal of the design engineer to concentrate the power of the signals into the bandwidth of interest. This is not only due to the desire to be as energy efficient as possible, but also because the amount of power that can be transmitted outside of the desired bandwidth is limited by the specification for each standard. The idea is to reduce interference by limiting radiation of RF frequencies beyond the necessary bandwidth .
A BIST designed into the device could potentially indicate status and eliminate the need for tests such as “turn-on time” or “lock time” . 8 Testing RF, SoC, and SiP Devices The focus of testing in this book is on RF, SoC, and SiP devices, which make up the front-end transceiver architecture used in the modern communications equipment that is overtaking the market in volume. This includes the signals from the antenna to the analog baseband portion of the chip, and the pertinent tests needed to characterize these in a production environment.
As always there are exceptions. As new technologies arrive, new tests or variations of older tests are encountered. The important thing is to understand the fundamentals of test and measurement and with that, all tests can be efficiently and effectively implemented. , and J. Kelly, Production Testing of RF and System-on-a Chip Devices for Wireless Communications, Norwood, MA: Artech House, 2004. , “Current Trends in Test-Handler Technology,” Evaluation Engineering, Vol. 36, No. 5, 1997. , “RF (Gigahertz) ATE Production Testing On-Wafer: Options and Tradeoffs,” Proc.